Authorship: Yoo T.S.H., Fernández A., Moreno F., Saiz J.M., Ossikovski R., Garcia-Caurel E.,
Congress: SPIE Photonics Europe 2018: Optical Micro- and Nanometrology (7º : 2018 : Estrasburgo)
Publisher: SPIE Society of Photo-Optical Instrumentation Engineers
Publication date: 01/05/2018
No. of pages: 11
Publication type: Conference object
DOI: 10.1117/12.2306170
ISSN: 0277-786X,1996-756X
Publication Url: https://doi.org/10.1117/12.2306170