Authorship: Hurtado A.A.P., Manana M., Teresa Villen Martinez M., Angel Olivan Monge M., Martinez Carrasco E., Rodriguez del Castillo C.,
Fuente: IEEE Transactions on Instrumentation and Measurement, 2025, 74, 9514413
Publisher: Institute of Electrical and Electronics Engineers
Publication date: 28/03/2025
No. of pages: 13
Publication type: Article
DOI: 10.1109/TIM.2025.3555681
ISSN: 0018-9456,1557-9662
Publication Url: https://doi.org/10.1109/TIM.2025.3555681