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Circuit-level stability and bifurcation analysis of non-foster circuits

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Congress: IEEE MTT-S International Microwave Symposium (IMS 2017): 4-9 June 2017, Honolulu, Hawai

Publisher: Institute of Electrical and Electronics Engineers, Inc.

Year of publication: 2017

No. of pages: 4

Pages: 340 a 343

Publication type: Conference object

DOI: 10.1109/MWSYM.2017.8059115

ISBN: 978-1-5090-6360-4

Spanish project: TEC2014-60283-C3-1-R

Publication Url: https://doi.org/10.1109/MWSYM.2017.8059115

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Authorship

ALMUDENA SUAREZ RODRIGUEZ

FRANCO ARIEL RAMIREZ TERAN

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