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Improving yield on RF-CMOS ICs

Other conference communications or articles related to authors from the University of Cantabria

 Congress: Spanish Conference on Electron Devices (CDE 2013): Proceedings of a meeting held 12-14 February 2013, Valladolid, Spain

 Publisher: Institute of Electrical and Electronics Engineers, Inc.

 Year of publication: 2013

 No. of pages: 104

 Pages: 237 a 340

 Publication type: Conference object

 DOI: 10.1109/CDE.2013.6481386

 ISBN: 978-1-4673-4666-5

 Spanish project: TEC2009-14219-C03-03

 Publication Url: https://doi.org/10.1109/CDE.2013.6481386

Authorship

YOLANDA JATO LLANO