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Using linear polarization to monitor nanoparticle purity

Abstract: Abstract We study the effect of contaminants on the resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the degree of linear polarization of light scattered at right angles to the incident beam, PL(90°)PL(90°). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We analyze this effect for a silicon nanosphere (R=200 nm) suspended in different media. We focus on the spectral range where the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances appear. The weakness of the resonances induced on the PL(90°)PL(90°) spectrum by the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, that is quantified as a function of material purity.

Otras publicaciones de la misma revista o congreso con autores/as de la Universidad de Cantabria

 Fuente: Journal of Quantitative Spectroscopy and Radiative Transfer, Volume 162, September 2014, Pages 190?196

Editorial: Elsevier Ltd

 Fecha de publicación: 01/09/2014

Nº de páginas: 7

Tipo de publicación: Artículo de Revista

 DOI: 10.1016/j.jqsrt.2015.03.005

ISSN: 0022-4073,1879-1352

Proyecto español: FIS2013-45854-P

Url de la publicación: https://doi.org/10.1016/j.jqsrt.2015.03.005

Autores/as

ANGELA INMACULADA BARREDA GOMEZ

JUAN MARCOS SANZ CASADO

RODRIGO ALCARAZ DE LA OSA

GORDEN WAYNE VIDEEN