Buscar

Estamos realizando la búsqueda. Por favor, espere...

 Detalle_Publicacion

Using linear polarization for sensing and monitoring nanoparticle purity

Abstract: We analyze the effect of contaminants on the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the linear polarization degree at right angle scattering configuration, PL(90º). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We study this effect for a silicon nanosphere of radius 200 nm embedded in different media. The weakness of the resonances induced on the PL(90º) spectrum because of the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, which is quantified as a function of material purity.

Otras comunicaciones del congreso o articulos relacionados con autores/as de la Universidad de Cantabria

 Congreso: SPIE Photonics Europe (2016 : Brussels)

Editorial: SPIE Society of Photo-Optical Instrumentation Engineers

 Año de publicación: 2016

Nº de páginas: 8

Tipo de publicación: Comunicación a Congreso

 DOI: 10.1117/12.2227774

ISSN: 0277-786X,1996-756X

Proyecto español: MICINN FIS2013-45854-P

Url de la publicación: https://doi.org/10.1117/12.2227774

Autores/as

ANGELA INMACULADA BARREDA GOMEZ

JUAN MARCOS SANZ CASADO

RODRIGO ALCARAZ DE LA OSA

GORDEN WAYNE VIDEEN