Abstract: A transmission/reflection microwave method based on uncalibrated S-parameter measurements for complex permittivity determination of dielectric materials is presented. There are three main advantages of the proposed method. First, the measurements are performed without the need of any calibration standards. Second, it does not require any additional dielectric sample with different thickness; two uncalibrated measurements are required: (i) with a sample filled waveguide and (ii) with an empty waveguide. Third, it does not need a precise location or precise shifting distance of the sample inside the waveguide. The method is iterative needing an initial guess to start the mathematical calculations, and high measurement accuracy can be expected. The method is validated by complex uncalibrated S-parameter measurements at X-band frequencies of low-loss samples (Teflon, Celotex and Duroplex) fitted into a waveguide section.

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