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Two-level stability analysis of complex circuits

Abstract: A new methodology is proposed for the small- and large-signal stability analysis of complex microwave systems, containing multiple active blocks. It is based on a calculation of the system characteristic determinant that ensures that this determinant does not exhibit any poles on the right-hand side (RHS) of the complex plane. This is achieved by partitioning the structure into simpler blocks that must be stable under either open-circuit (OC) or short-circuit (SC) terminations. Thus, the system stability is evaluated using a two-level procedure. The first level is the use of pole-zero identification to define the OC- or SC-stable blocks, which, due to the limited block size, can be applied reliably. In large-signal operation, the OC- or SC-stable blocks are described in terms of their outer-tier conversion matrices. The second level is the calculation and analysis of the characteristic determinant of the complete system at the ports defined in the partition. The roots of the characteristic determinant define the stability properties. The Nyquist criterion can be applied since, by construction, the determinant cannot exhibit any poles in the RHS. In addition, one can use pole-zero identification to obtain the values of the determinant zeroes. Because the determinant is calculated at a limited number of ports, the analysis complexity is greatly reduced.

Otras publicaciones de la misma revista o congreso con autores/as de la Universidad de Cantabria

 Autoría: Suarez A., Ramirez F.,

 Fuente: IEEE Transactions on Microwave Theory and Techniques, 2021, 69(1), 132 -146

Editorial: Institute of Electrical and Electronics Engineers Inc.

 Fecha de publicación: 01/01/2021

Nº de páginas: 16

Tipo de publicación: Artículo de Revista

 DOI: 10.1109/TMTT.2020.3036889

ISSN: 0018-9480,1557-9670

Proyecto español: TEC2017-88242-C3-1-R

Url de la publicación: https://doi.org/10.1109/TMTT.2020.3036889