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Noise conversion of Schottky diodes in mm-wave detectors under different nonlinear regimes: modeling and simulation versus measurement

Abstract: This paper presents and discusses several methods for predicting the low-frequency (LF) noise at the output of a mm-wave detector. These methods are based on the extraction of LF noise source parameters from the single diode under a specific set of bias conditions and the transfer or conversion of these noise sources, under different operating conditions including cyclostationary regime, to the quasi-dc output of a mm-wave detector constructed with the same model of diode. The noise analysis is based on a conversion-matrix type formulation, which relates the carrier noisy sidebands of the input signal with the detector output spectrum through a pair of transfer functions obtained in commercial software. Measurements of detectors in individual and differential setups will be presented and compared with predictions.

 Autoría: Gutiérrez J., Zeljami K., Villa E., Aja B., De La Fuente M., Sancho S., Pascual J.,

 Fuente: International Journal of Microwave and Wireless Technologies, 2016, 8 (3), 479–493

 Editorial: Cambridge University Press

 Fecha de publicación: 01/05/2016

 Nº de páginas: 15

 Tipo de publicación: Artículo de Revista

 DOI: 10.1017/S1759078715001518

 ISSN: 1759-0787

 Proyecto español: TEC2011-29264-C03-01 ; CSD2008-00068 ; TEC2014-58341-C4-1-R ; CSD2010-00064

 Url de la publicación: https://doi.org/10.1017/S1759078715001518