Abstract: We experimentally study a quantum random number generator based on the random excitation of the linearly polarized modes of a gain-switched vertical-cavity surface-emitting laser (VCSEL). Our device is characterized by having polarization switching under continuous wave operation. By measuring the linear polarization mode that is excited in each pulse we collect a sufficient number of bits to evaluate if a standard statistical test suite is passed. We consider linear and Von Neumann post-processing methods in order to reduce the bias with different levels of bits rejection. The post-processed bit strings pass all tests in the standard test suite for random number generators provided by the National Institute of Standards and Technology (NIST). We finally compare the results obtained with different post-processing functions, including several [n, k, d] linear BCH codes. We show that large values of n and k are the best choice to obtain simultaneously improved throughput and randomness.

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