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Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry

Abstract: This paper discusses the fundamentals, applications, potential and limitations of polarized light reflection techniques for the characterization of phase-change materials (PCMs). These techniques include spectroscopic ellipsometry, time-resolved ellipsometry and imaging ellipsometry as well as polarimetry. We explore the capabilities of spectroscopic ellipsometry in the determination of the extinction coefficient of PCMs and the capabilities of imaging ellipsometry to characterize PCMs. We show that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about crystallization/amorphization kinetics and mapping anisotropies.

 Fuente: Thin Solid Films, 2020, 763, 139580

 Editorial: Elsevier

 Fecha de publicación: 01/12/2022

 Nº de páginas: 10

 Tipo de publicación: Artículo de Revista

 DOI: 10.1016/j.tsf.2022.139580

 ISSN: 0040-6090,1879-2731

 Proyecto europeo: info:eu-repo/grantAgreement/EC/H2020/ 899598/eu/Active Optical Phase-Change Plasmonic Transdimensional Systems Enabling Femtojoule and Femtosecond Extreme Broadband Adaptive Reconfigurable Devices/PHEMTRONICS/

 Url de la publicación: https://doi.org/10.1016/j.tsf.2022.139580

Autoría

ESPINOZA, SHIRLY

ZAHRADNÍK, MARTIN

KHAKUREL, KRISHNA

RESL, JOSEF

COBET, CHRISTOPH

HINGERL, KURT

DUWE, MATTHIAS

THIESEN, PETER

LOSURDO, MARIA