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An accurate method to estimate complex permittivity of dielectric materials at X-band frequencies

Abstract: In this paper, a measurement method is presented to estimate the complex permittivity of a dielectric material even if its length is higher than the half wavelength in the waveguide. The Sij-parameters at reference planes in the rectangular waveguide loaded by material sample are measured by Network Analyzer. First of all, the expression of the complex permittivity as a function of Sij-parameters are calculated by applying the transmission lines theory. Further, a comparison of the estimated values of the complex permittivity obtained from the presented method and the Nicholson-Ross method is presented. Finally, the results for complex permittivity of Teflon, Nylon and Verde measured at the X-band frequencies are presented.

 Autoría: Benali L.A., Tribak A., Terhzaz J., Mediavilla A.,

 Fuente: International Journal of Microwave and Optical Technology, 2020, 15(1), 10-16

 Editorial: Electrical Engineering Department, University of Nevada

 Fecha de publicación: 01/01/2020

 Nº de páginas: 7

 Tipo de publicación: Artículo de Revista

 ISSN: 1553-0396

Autoría

AIT BENALI, LAHCEN

ABDELWAHED TRIBAK

TERHZAZ, JAOUAD

ANGEL MEDIAVILLA SANCHEZ