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Imaging ellipsometry on exfoliated GaS on sapphire substrate

Delta and Psi maps measured for wavelengths 200 nm to 900 nm with an Accurion EP4 ellipsometer. Ellipsometric enhanced contrast micrograph of the measured region - map.jpg. Plotted Delta and Psi maps for 2, 2.5, 3, 3.2 and 3.5 eV are included.

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Repositorio: Zenodo

Año de publicación: 2022

DOI: 10.5281/zenodo.6034897

Citación completa: Gutierrez, Y., Juan, D., Dicorato, S., Santos, G., Duwe, M., Thiesen, P., Giangregorio, M. M., Palumbo, F., Hingerl, K., Cobet, C., Garcia-Fernandez, P., Junquera, J., Moreno, F., & Losurdo, M. (2022). Imaging ellipsometry on exfoliated GaS on sapphire substrate [Dataset]. (Version v1). Zenodo. https://doi.org/10.5281/zenodo.6034897

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