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Imaging ellipsometry on exfoliated GaS on sapphire substrate

Delta and Psi maps measured for wavelengths 200 nm to 900 nm with an Accurion EP4 ellipsometer. Ellipsometric enhanced contrast micrograph of the measured region - map.jpg. Plotted Delta and Psi maps for 2, 2.5, 3, 3.2 and 3.5 eV are included.

Related publications

Layered gallium sulfide optical properties from monolayer to CVD crystalline thin films - Article

Repository: Zenodo

Year of publication: 2022

DOI: 10.5281/zenodo.6034897

Full citation: Gutierrez, Y., Juan, D., Dicorato, S., Santos, G., Duwe, M., Thiesen, P., Giangregorio, M. M., Palumbo, F., Hingerl, K., Cobet, C., Garcia-Fernandez, P., Junquera, J., Moreno, F., & Losurdo, M. (2022). Imaging ellipsometry on exfoliated GaS on sapphire substrate [Dataset]. (Version v1). Zenodo. https://doi.org/10.5281/zenodo.6034897

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