Repository: Zenodo
Year of publication: 2022
DOI: 10.5281/zenodo.6034897
Full citation: Gutierrez, Y., Juan, D., Dicorato, S., Santos, G., Duwe, M., Thiesen, P., Giangregorio, M. M., Palumbo, F., Hingerl, K., Cobet, C., Garcia-Fernandez, P., Junquera, J., Moreno, F., & Losurdo, M. (2022). Imaging ellipsometry on exfoliated GaS on sapphire substrate [Dataset]. (Version v1). Zenodo. https://doi.org/10.5281/zenodo.6034897