Fuente: IEEE Instrumentation and Measurement Magazine, 2020, 23(1), 56-63
Publisher: Institute of Electrical and Electronics Engineers Inc.
Publication date: 01/02/2020
No. of pages: 8
Publication type: Article
DOI: 10.1109/MIM.2020.8979525
ISSN: 1094-6969,1941-0123
Spanish project: PGC2018-099530-B-C31
Publication Url: https://doi.org/10.1109/MIM.2020.8979525