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Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible range

Abstract: Since polarimetry has extended its use for the study of scattering from surfaces and tissues, Spectralon, a white reflectance standard, is acquiring the role of a polarimetric standard. Both the behavior of Spectralon as a Lambertian surface and its performance as a perfect depolarizer are analyzed in detail. The accuracy of our dynamic polarimeter, together with the polar decomposition to describe the Mueller matrix (MM) depolarizing action, combine to produce a powerful tool for the proper analysis of this scattering surface. Results allowed us to revisit, for confirmation or revision, the role of some MM elements, as described in the bibliography. The conditions under which it can be considered a good Lambertian surface are specified in terms of incidence and scattering angle and verified over a large wavelength range.

 Authorship: Sanz J., Extremiana C., Saiz J.,

 Fuente: Applied Optics, 2013, 52(24), 6051-6062

 Publisher: Hasta 2008 incluído : Optical Society of America A partir de 2009: The Optical Society (OSA)

 Year of publication: 2013

 No. of pages: 12

 Publication type: Article

 DOI: 10.1364/AO.52.006051

 ISSN: 1559-128X,2155-3165

 Spanish project: FIS2010-21984

 Publication Url: https://doi.org/10.1364/AO.52.006051

Authorship

JUAN MARCOS SANZ CASADO

CRISTINA EXTREMIANA VAZQUEZ