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Abstract: In this paper, a new iterative method is presented to estimate the dielectric constant and loss tangent for each layer in a Bi-layer dielectric material using an X-band short-circuited rectangular waveguide WR90. The S11-parameter at the reference plane as a function of dielectric constant and loss tangent of each layer is calculated by applying the two-dimensional finite difference in time-domain method (2DFDTD) for the wave equation. Then, the Nelder-Mead algorithm is applied to estimate the dielectric constant and the loss tangent by matching the measured and calculated S11-parameter. This method has been validated on three bi-layer dielectric materials such as Teflon-FR4 Epoxy and FR4 Epoxy-Plexiglas and Plexiglas-Teflon. A comparison of estimated values of the dielectric constant and loss tangent obtained from FDTD-2D Maxwell's equations measurements and 2D-FDTD Wave equation measurements is presented. Remarkably, this method reduces the execution time by a factor of five while maintaining equal precision.
Fuente: International Journal of Microwave and Optical Technology, 2023, 18(6) 575-582
Publisher: Electrical Engineering Department, University of Nevada
Publication date: 01/11/2023
No. of pages: 8
Publication type: Article
ISSN: 1553-0396
Consult in UCrea
AIT BENALI, LAHCEN
ABDELWAHED TRIBAK
TERHZAZ, JAOUAD
TOMAS FERNANDEZ IBAÑEZ
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