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Controlled high order mode generation for tracking coupler bench test

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Congress: IEEE/MTT-S International Microwave Symposium (IMS 2020): Proceedings of a meeting held 4-6 August 2020, Los Angeles, California, USA

Publisher: Institute of Electrical and Electronics Engineers, Inc.

Year of publication: 2020

No. of pages: 4

Pages: 904 a 907

Publication type: Conference object

DOI: 10.1109/IMS30576.2020.9224025

ISBN: 978-1-7281-6816-6

Publication Url: https://doi.org/10.1109/IMS30576.2020.9224025

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Authorship

CECCATO, GABRIELE

JUAN LUIS CANO DE DIEGO

ANGEL MEDIAVILLA SANCHEZ

PERREGRINI, LUCA

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