Congress: 15th IEEE European Test Symposium: May 24-28 2010, Prague, Czech Republic

 Publisher: Institute of Electrical and Electronics Engineers, Inc.

 Year of publication: 2010

 No. of pages: 6

 Pages: 164 a 169

 Publication type: Conference object

 DOI: 10.1109/ETSYM.2010.5512765

 ISBN: 978-1-4244-5835-6

 Publication Url: https://doi.org/10.1109/ETSYM.2010.5512765