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Detalle_Publicacion

Design-for-Test method for high-speed ADCs: behavioral description and optimization

 Congress: Proceedings of the 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): April 13-15 2011 Cottbus, Germany

Publisher: Institute of Electrical and Electronics Engineers, Inc.

 Year of publication: 2011

No. of pages: 6

Pages: 35 a 40

Publication type: Conference object

 DOI: 10.1109/DDECS.2011.5783043

ISBN: 978-1-4244-9756-0

 Spanish project: TEC2007-65588/MIC

Publication Url: https://doi.org/10.1109/DDECS.2011.5783043