Abstract: Microporous titanosilicate ETS-10 crystals have been analyzed by advanced electron microscopy techniques. With the last generation of spherical aberration corrected electron microscopes, truly atomic resolution images have been recorded. Owing to the extremely high-resolution images that have been obtained, the multiple defects (stacking faults, lack of porosity and "double-pores") present in this type of material can be analyzed in great detail.

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