Article
IEEE Micro, 2014, 34(5), 52-63, 77
Authorship: LAURENT SCHARES, BENJAMIN G. LEE, FABIO CHECCONI, RUSSELL BUDD, ALEXANDER RYLYAKOV, NICOLAS DUPUIS, FABRIZIO PETRINI, CLINT L. SCHOW, PABLO FUENTES SAEZ, OLIVER MATTES, CYRIEL MINKENBERG
01/09/2014